top of page

色散共聚焦線掃高精密3D量測

Chromatic Confocal Line Scanning for High Precision 3D Metrology

Demo Kit

Demo.png

Advantages

Micron/Submicron 3D Observation/ Measurement

Observe steps in the nanometer range and measure height differences at the submicron level.

Versatility in Application

Suitable for all kinds of surfaces: diffuse, highly reflective, multi-layer transparent surfaces, etc.

Noncontact, Nondestructive, and Fast

No sample preparation required—simply place the sample on the stage then you can measure/observe.

Suitable for various surfaces

Mirrors

M01.png
T01.png

Multi Glasses

M02.png
T02.png

Metal

M03.png
T03.png

Plastic

M04.png
T04.png

Paper

M05.png
T05.png

Fabric

M06.png
T06.png

Application Areas

semiconductors.jpeg

Semiconductor

• BGA (Ball Grid Array)

• Bumping

• TSV (Through Silicon Via)

• RDL (Re-distributed layer)

App01.png
microelectronics.jpg

Microelectronics

• Packaging

• Assembling

• SMT

App02.png
Lens.jpg

Optics

• Lens/Glass Thickness

• Lens Surface Topography 

• Air gap

App03.png

Are You Ready to Accelerate Your and Our Business?

Believe that the communication and cooperation between you and us will produce great success.

bottom of page