top of page

色散共聚焦線掃高精密3D量測
Chromatic Confocal Line Scanning for High Precision 3D Metrology

Advantages
Micron/Submicron 3D Observation/ Measurement
Observe steps in the nanometer range and measure height differences at the submicron level.
Versatility in Application
Suitable for all kinds of surfaces: diffuse, highly reflective, multi-layer transparent surfaces, etc.
Noncontact, Nondestructive, and Fast
No sample preparation required—simply place the sample on the stage then you can measure/observe.
Suitable for various surfaces
Mirrors


Multi Glasses


Metal


Plastic


Paper


Fabric


bottom of page