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色散共聚焦線掃高精密3D量測

Chromatic Confocal Line Scanning for High Precision 3D Metrology

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 Line Confocal
3D Sensor & Profilometer

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Advantages

Micron/Submicron 3D Observation/ Measurement

Observe steps in the nanometer range and measure height differences at the submicron level.

Versatility in Application

Suitable for all kinds of surfaces: diffuse, highly reflective, multi-layer transparent surfaces, etc.

Noncontact, Nondestructive, and Fast

No sample preparation required—simply place the sample on the stage then you can measure/observe.

Suitable for various surfaces

Mirrors

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Multi Glasses

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Metal

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Plastic

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Paper

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Fabric

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Application Areas

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Semiconductor

• BGA (Ball Grid Array)

• Bumping

• TSV (Through Silicon Via)

• RDL (Re-distributed layer)

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Microelectronics

• 3D Packaging

• SMT

• Assembling

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Optics

• Lens/Glass Thickness

• Lens Surface Topography 

• Air gap

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Are You Ready to Accelerate Your and Our Business?

Believe that the communication and cooperation between you and us will produce great success.

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