top of page
01.png

Chromatic Confocal Line Scanning

S01.png

Advantages

Micron/Submicron 3D Observation/ Measurement

Observe steps in the nanometer range and measure height differences at the submicron level.

Versatility in Application

Suitable for all kinds of surfaces: diffuse, highly reflective, multi-layer transparent surfaces, etc.

Noncontact, Nondestructive, and Fast

No sample preparation required—simply place the sample on the stage then you can measure/observe.

bottom of page